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dc.creatorTrainer, DJ
dc.creatorPutilov, AV
dc.creatorDi Giorgio, C
dc.creatorSaari, T
dc.creatorWang, B
dc.creatorWolak, M
dc.creatorChandrasena, RU
dc.creatorLane, C
dc.creatorChang, TR
dc.creatorJeng, HT
dc.creatorLin, H
dc.creatorKronast, F
dc.creatorGray, AX
dc.creatorXi, XX
dc.creatorNieminen, J
dc.creatorBansil, A
dc.creatorIavarone, M
dc.date.accessioned2021-01-25T15:18:03Z
dc.date.available2021-01-25T15:18:03Z
dc.date.issued2017-01-13
dc.identifier.issn2045-2322
dc.identifier.issn2045-2322
dc.identifier.doihttp://dx.doi.org/10.34944/dspace/4943
dc.identifier.other28084465 (pubmed)
dc.identifier.urihttp://hdl.handle.net/20.500.12613/4961
dc.description.abstract© The Author(s) 2017. Recent progress in the synthesis of monolayer MoS 2, a two-dimensional direct band-gap semiconductor, is paving new pathways toward atomically thin electronics. Despite the large amount of literature, fundamental gaps remain in understanding electronic properties at the nanoscale. Here, we report a study of highly crystalline islands of MoS 2 grown via a refined chemical vapor deposition synthesis technique. Using high resolution scanning tunneling microscopy and spectroscopy (STM/STS), photoemission electron microscopy/spectroscopy (PEEM) and μ-ARPES we investigate the electronic properties of MoS 2 as a function of the number of layers at the nanoscale and show in-depth how the band gap is affected by a shift of the valence band edge as a function of the layer number. Green's function based electronic structure calculations were carried out in order to shed light on the mechanism underlying the observed bandgap reduction with increasing thickness, and the role of the interfacial Sulphur atoms is clarified. Our study, which gives new insight into the variation of electronic properties of MoS 2 films with thickness bears directly on junction properties of MoS 2, and thus impacts electronics application of MoS 2.
dc.format.extent40559-
dc.language.isoen
dc.relation.haspartScientific Reports
dc.relation.isreferencedbySpringer Science and Business Media LLC
dc.rightsCC BY
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/
dc.titleInter-Layer Coupling Induced Valence Band Edge Shift in Mono- to Few-Layer MoS 2
dc.typeArticle
dc.type.genreJournal Article
dc.relation.doi10.1038/srep40559
dc.ada.noteFor Americans with Disabilities Act (ADA) accommodation, including help with reading this content, please contact scholarshare@temple.edu
dc.date.updated2021-01-25T15:17:58Z
refterms.dateFOA2021-01-25T15:18:03Z


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