Enhancement of lower critical field by reducing the thickness of epitaxial and polycrystalline MgB2 thin films
Wolak, M. A.
Lang, Andrew C.
Taheri, Mitra L.
Xi, X. X.
Permanent link to this recordhttp://hdl.handle.net/20.500.12613/8725
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AbstractFor potential applications in superconducting RF cavities, we have investigated the properties of polycrystalline MgB2 films, including the thickness dependence of the lower critical field Hc1. MgB2 thin films were fabricated by hybrid physical-chemical vapor deposition on (0001) SiC substrate either directly (for epitaxial films) or with a MgO buffer layer (for polycrystalline films). When the film thickness decreased from 300 nm to 100 nm, Hc1 at 5 K increased from around 600 Oe to 1880 Oe in epitaxial films and to 1520 Oe in polycrystalline films. The result is promising for using MgB2/MgO multilayers to enhance the vortex penetration field.
CitationTeng Tan, M. A. Wolak, Narendra Acharya, Alex Krick, Andrew C. Lang, Jennifer Sloppy, Mitra L. Taheri, L. Civale, Ke Chen, and X. X. Xi , "Enhancement of lower critical field by reducing the thickness of epitaxial and polycrystalline MgB2 thin films", APL Materials 3, 041101 (2015) https://doi.org/10.1063/1.4916696
Citation to related workAIP Publishing
Has partAPL Materials, Vol. 3, Iss. 4
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