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dc.creatorTai, T
dc.creatorXi, XX
dc.creatorZhuang, CG
dc.creatorMircea, DI
dc.creatorAnlage, SM
dc.date.accessioned2021-02-04T21:52:42Z
dc.date.available2021-02-04T21:52:42Z
dc.date.issued2011-06-01
dc.identifier.issn1051-8223
dc.identifier.issn1558-2515
dc.identifier.doihttp://dx.doi.org/10.34944/dspace/6017
dc.identifier.other770DW (isidoc)
dc.identifier.urihttp://hdl.handle.net/20.500.12613/6035
dc.description.abstractNiobium-based Superconducting Radio Frequency (SRF) cavity performance is sensitive to localized defects that give rise to quenches at high accelerating gradients. In order to identify these material defects on bulk Nb surfaces at their operating frequency and temperature, it is important to develop a new kind of wide bandwidth microwave microscopy with localized and strong RF magnetic fields. By taking advantage of write head technology widely used in the magnetic recording industry, one can obtain ̃200 mT RF magnetic fields, which is on the order of the thermodynamic critical field of Nb, on sub-micron length scales on the surface of the superconductor. We have successfully induced the nonlinear Meissner effect via this magnetic write head probe on a variety of superconductors. This design should have a high spatial resolution and is a promising candidate to find localized defects on bulk Nb surfaces and thin film coatings of interest for accelerator applications. © 2010 IEEE.
dc.format.extent2615-2618
dc.relation.haspartIEEE Transactions on Applied Superconductivity
dc.relation.isreferencedbyInstitute of Electrical and Electronics Engineers (IEEE)
dc.subjectHarmonic generation
dc.subjectmagnetic write head
dc.subjectmicrowave microscope
dc.subjectnear-field
dc.subjectnonlinear Meissner effect
dc.subjectRF superconductivity
dc.titleNonlinear near-field microwave microscope for RF defect localization in superconductors
dc.typeArticle
dc.type.genreJournal Article
dc.relation.doi10.1109/TASC.2010.2096531
dc.ada.noteFor Americans with Disabilities Act (ADA) accommodation, including help with reading this content, please contact scholarshare@temple.edu
dc.date.updated2021-02-04T21:52:39Z
refterms.dateFOA2021-02-04T21:52:43Z


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