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dc.creatorTai, T
dc.creatorGhamsari, BG
dc.creatorBieler, TR
dc.creatorTan, T
dc.creatorXi, XX
dc.creatorAnlage, SM
dc.date.accessioned2021-02-03T18:56:43Z
dc.date.available2021-02-03T18:56:43Z
dc.date.issued2014-06-09
dc.identifier.issn0003-6951
dc.identifier.issn1077-3118
dc.identifier.doihttp://dx.doi.org/10.34944/dspace/5858
dc.identifier.otherAJ7QM (isidoc)
dc.identifier.urihttp://hdl.handle.net/20.500.12613/5876
dc.description.abstractA localized measurement of the RF critical field on superconducting radio frequency (SRF) cavity materials is a key step to identify specific defects that produce quenches of SRF cavities. Two measurements are performed to demonstrate these capabilities with a near-field scanning probe microwave microscope. The first is a third harmonic nonlinear measurement on a high Residual-Resistance- Ratio bulk Nb sample showing strong localized nonlinear response, with surface RF magnetic field Bsurface∼ 102 mT. The second is a raster scanned harmonic response image on a MgB2 thin film demonstrating a uniform nonlinear response over large areas. © 2014 AIP Publishing LLC.
dc.format.extent232603-232603
dc.language.isoen
dc.relation.haspartApplied Physics Letters
dc.relation.isreferencedbyAIP Publishing
dc.subjectcond-mat.supr-con
dc.subjectcond-mat.supr-con
dc.titleNear-field microwave magnetic nanoscopy of superconducting radio frequency cavity materials
dc.typeArticle
dc.type.genreJournal Article
dc.relation.doi10.1063/1.4881880
dc.ada.noteFor Americans with Disabilities Act (ADA) accommodation, including help with reading this content, please contact scholarshare@temple.edu
dc.date.updated2021-02-03T18:56:41Z
refterms.dateFOA2021-02-03T18:56:44Z


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