Near-field microwave magnetic nanoscopy of superconducting radio frequency cavity materials
dc.creator | Tai, T | |
dc.creator | Ghamsari, BG | |
dc.creator | Bieler, TR | |
dc.creator | Tan, T | |
dc.creator | Xi, XX | |
dc.creator | Anlage, SM | |
dc.date.accessioned | 2021-02-03T18:56:43Z | |
dc.date.available | 2021-02-03T18:56:43Z | |
dc.date.issued | 2014-06-09 | |
dc.identifier.issn | 0003-6951 | |
dc.identifier.issn | 1077-3118 | |
dc.identifier.doi | http://dx.doi.org/10.34944/dspace/5858 | |
dc.identifier.other | AJ7QM (isidoc) | |
dc.identifier.uri | http://hdl.handle.net/20.500.12613/5876 | |
dc.description.abstract | A localized measurement of the RF critical field on superconducting radio frequency (SRF) cavity materials is a key step to identify specific defects that produce quenches of SRF cavities. Two measurements are performed to demonstrate these capabilities with a near-field scanning probe microwave microscope. The first is a third harmonic nonlinear measurement on a high Residual-Resistance- Ratio bulk Nb sample showing strong localized nonlinear response, with surface RF magnetic field Bsurface∼ 102 mT. The second is a raster scanned harmonic response image on a MgB2 thin film demonstrating a uniform nonlinear response over large areas. © 2014 AIP Publishing LLC. | |
dc.format.extent | 232603-232603 | |
dc.language.iso | en | |
dc.relation.haspart | Applied Physics Letters | |
dc.relation.isreferencedby | AIP Publishing | |
dc.subject | cond-mat.supr-con | |
dc.subject | cond-mat.supr-con | |
dc.title | Near-field microwave magnetic nanoscopy of superconducting radio frequency cavity materials | |
dc.type | Article | |
dc.type.genre | Journal Article | |
dc.relation.doi | 10.1063/1.4881880 | |
dc.ada.note | For Americans with Disabilities Act (ADA) accommodation, including help with reading this content, please contact scholarshare@temple.edu | |
dc.date.updated | 2021-02-03T18:56:41Z | |
refterms.dateFOA | 2021-02-03T18:56:44Z |