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dc.creatorPosik, M
dc.creatorSurrow, B
dc.creatorIEEE
dc.date.accessioned2021-02-03T18:19:04Z
dc.date.available2021-02-03T18:19:04Z
dc.date.issued2015
dc.identifier.issn1095-7863
dc.identifier.doihttp://dx.doi.org/10.34944/dspace/5814
dc.identifier.otherBI6TR (isidoc)
dc.identifier.urihttp://hdl.handle.net/20.500.12613/5832
dc.description.abstractMany experiments are currently using or proposing to use large area GEM foils in their detectors, which is creating a need for commercially available GEM foils. Currently CERN is the only main distributor of GEM foils, however with the growing interest in GEM technology keeping up with the increasing demand for GEM foils will be difficult. Thus the commercialization of GEM foils has been established by Tech-Etch Inc. of Plymouth, MA, USA using the single-mask technique, which is capable of producing GEM foils over a meter long. To date Tech-Etch has successfully manufactured 10 $\times$ 10 cm$^2$ and 40 $\times$ 40 cm$^2$ GEM foils. We will report on the electrical and geometrical properties, along with the inner and outer hole diameter size uniformity of these foils. Furthermore, Tech-Etch has now begun producing even larger GEM foils of 50 $\times$ 50 cm$^2$, and are currently looking into how to accommodate GEM foils on the order of one meter long. The Tech-Etch foils were found to have excellent electrical properties. The measured mean optical properties were found to reflect the desired parameters and are consistent with those measured in double-mask GEM foils, as well as single-mask GEM foils produced at CERN. They also show good hole diameter uniformity over the active area.
dc.format.extent1-4
dc.relation.haspart2015 IEEE NUCLEAR SCIENCE SYMPOSIUM AND MEDICAL IMAGING CONFERENCE (NSS/MIC)
dc.subjectphysics.ins-det
dc.subjectphysics.ins-det
dc.subjecthep-ex
dc.subjectnucl-ex
dc.titleR&D of Commercially Manufactured Large GEM Foils
dc.typeArticle
dc.relation.doi10.1109/nssmic.2015.7581802
dc.ada.noteFor Americans with Disabilities Act (ADA) accommodation, including help with reading this content, please contact scholarshare@temple.edu
dc.date.updated2021-02-03T18:19:02Z
refterms.dateFOA2021-02-03T18:19:05Z


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