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dc.creatorPosik, M
dc.creatorSurrow, B
dc.date.accessioned2021-02-03T17:01:36Z
dc.date.available2021-02-03T17:01:36Z
dc.date.issued2015-12-01
dc.identifier.issn0168-9002
dc.identifier.issn1872-9576
dc.identifier.doihttp://dx.doi.org/10.34944/dspace/5741
dc.identifier.otherCS7RP (isidoc)
dc.identifier.urihttp://hdl.handle.net/20.500.12613/5759
dc.description.abstract© 2015 Elsevier B.V. All rights reserved. With interest in large area GEM foils increasing and CERN being the only main distributor, keeping up with the demand for GEM foils will be difficult. Thus the commercialization of GEMs is being established by Tech-Etch of Plymouth, MA, USA using single-mask techniques. We report here on the first of a two step quality verification of the commercially produced 10×10 cm<sup>2</sup> and 40×40 cm<sup>2</sup> GEM foils, which includes characterizing their electrical and geometrical properties. We have found that the Tech-Etch foils display excellent electrical properties, as well as uniform and consistent hole diameters comparable to established foils produced by CERN.
dc.format.extent10-15
dc.language.isoen
dc.relation.haspartNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
dc.relation.isreferencedbyElsevier BV
dc.subjectGEM
dc.subjectEIC
dc.subjectSingle-mask
dc.subjectTracking
dc.subjectMicro-pattern gas detectors
dc.titleOptical and electrical performance of commercially manufactured large GEM foils
dc.typeArticle
dc.type.genreJournal Article
dc.relation.doi10.1016/j.nima.2015.08.048
dc.ada.noteFor Americans with Disabilities Act (ADA) accommodation, including help with reading this content, please contact scholarshare@temple.edu
dc.date.updated2021-02-03T17:01:33Z
refterms.dateFOA2021-02-03T17:01:36Z


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